Pulse I-L Characteristic Test Device MODEL: SEC-PL4000
High-speed pulse driving of laser diodes to measure I-L and I-Vf characteristics!
This device measures the I-L and I-Vf characteristics by driving a laser diode with high-speed pulse operation. It enables the measurement of the kink characteristics of I-L under pulse modulation, which cannot be obtained in CW, down to short pulse widths. The obtained data is displayed and processed on Windows. The LD head is equipped with 4 channels of LD sockets for 5.6Φ and 3.3Φ, so the LD element is mounted in the socket that matches the type of LD being measured (5.6Φ or 3.3Φ). Depending on the measurement conditions set in the software, the LD drive and PD receiving signal are automatically selected and measured using RF SW operation.
- Company：システム技研
- Price：Other
